Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

  • ISBN 13:


  • ISBN 10:


  • Edition: 1st
  • Format: Hardcover
  • Copyright: 10/25/2013
  • Publisher: CRC Press

Note: Not guaranteed to come with supplemental materials (access cards, study guides, lab manuals, CDs, etc.)

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Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DiM)-related rule violations. The book also addresses small-delay defects (SDDs) and testing, which can cause immediate failures if introduced on both critical and non-critical paths in the circuit.

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