FREE SHIPPING BOTH WAYS
ON EVERY ORDER!
LIST PRICE:
$149.95

OUR PRICE:
$118.76

You may extend rentals at any time.


Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

ISBN: 9781439829417 | 1439829411
Edition: 1st
Format: Hardcover
Publisher: CRC Press
Pub. Date: 10/25/2013

Why Rent from Knetbooks?

Because Knetbooks knows college students. Our rental program is designed to save you time and money. Whether you need a textbook for a semester, quarter or even a summer session, we have an option for you. Simply select a rental period, enter your information and your book will be on its way!

Top 5 reasons to order all your textbooks from Knetbooks:

  • We have the lowest prices on thousands of popular textbooks
  • Free shipping both ways on ALL orders
  • Most orders ship within 48 hours
  • Need your book longer than expected? Extending your rental is simple
  • Our customer support team is always here to help
Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DiM)-related rule violations. The book also addresses small-delay defects (SDDs) and testing, which can cause immediate failures if introduced on both critical and non-critical paths in the circuit.


Please wait while this item is added to your cart...