Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers modern focused ion beam workstations, scanning electron microscopes and transmission electron microscopes, while also showing how to combine them for real-time observation. The text begins with introductory material and the basics, before going on to cover the techniques needed to determine growth processes, melting, reactions, and doping as well as mechanical, magnetic, optical and electronic properties. A final section is devoted to soft matter.